服務
-
SERVICE
Testing Service
福懋科技提供專業的記憶體IC預燒、測試及晶圓針測服務,我們也提供客戶測試程式驗證、 Tester/Hi-Fix比對校驗、工程批及量產批驗證、並透過網路定時提供客戶即時的相關報表之服務。
福懋科技提供專業且高精密的晶圓等級測試服務,晶圓針測機可承載的晶圓尺寸為8"及12",提供製程溫度範圍從-55'C到150'C。福懋科技亦備有全自動晶圓檢查機,提供快速且高可信度的晶圓外觀品質管控。 在生產管理方面,我們在SEMI標準下建構以RF ID為識別的生產管理系統,有效管理生產作業並提供客戶即時正確的生產資訊。
Wafer Probe T5377S

# | Tester | Advantest T5377S |
---|---|---|
1 | Speed | 142MHZ |
2 | DR channel | 2048 |
3 | IO channel | 1024 |
4 | PPS unit | 256 |
5 | DC unit | 128 |
6 | Duts | 256 |
Wafer Probe T5385

# | Tester | Advantest T5385 |
---|---|---|
1 | Speed | 266MHZ |
2 | DR channel | 2400 |
3 | IO channel | 4320 |
4 | LVDR channel | 480 |
5 | HCDR channel | 480 |
6 | PPS channel | 960 |
7 | Duts | 512 |
提供專業的DRAM、NAND Flash、NOR Flash、MCP等記憶體產品TDBI預燒之服務。
TDBI SSE –B920

# | Burn-In Oven | SSE –B920 |
---|---|---|
1 | Burn-In Type | TDBI |
2 | Slot Qty | 48 |
3 | Channel | 184 |
4 | Driver Voltage | VIH : 2V ~ 8.0V
VIL : < 0.4V Resolution : 10mV |
5 | Driver Capacity | Sink Current : 120mA
Source Current : 120mA |
6 | Driver Skew | ±5ns |
7 | Overshoot / Undershoot | Within 10% |
8 | Tr / Tf | Less 25ns(with load) |
9 | Address | X:16bits Y:16bits |
TDBI Advantest B6700

# | Burn-In Oven | Advantest B6700 |
---|---|---|
1 | Burn-In Type | TDBI |
2 | Slot Qty | 48 |
3 | Channel | 72 IO + 100 Driver |
4 | Driver Voltage | VIH : 0.4V ~ 4.0V
VIL : 0.0V(Fix) Accuracy : ±(2.5%+50mV) |
5 | Driver Capacity | Sink Current : 30mA
Source Current : 30mA |
6 | Driver Skew | ±8ns |
7 | Tr / Tf | Less than 25ns@500pF
(2.0Vp-p,20%~80%) |
8 | Address | X:24bits Y:24bits CA:24bits |
9 | Power Supply | 126A |
TDBI Ando AF8652
# | Burn-In Oven | Ando AF8652 |
---|---|---|
1 | Burn-In Type | TDBI |
2 | Slot Qty | 48 |
3 | Channel | 154 |
4 | Driver Voltage | VIH : 1V ~ 7.0V
VIL : < 50mV Resolution : 10mV |
5 | Driver Capacity | Sink Current : 200mA
Source Current : 200mA |
6 | Driver Skew | ±5ns |
7 | Overshoot / Undershoot | Within 10% |
8 | Tr / Tf | Less 30ns(with load) |
9 | Address | X:16bits Y:16bits |
TDBI DI AF8862C7H2
# | Burn-In Oven | DI AF8862C7H2 |
---|---|---|
1 | Burn-In Type | TDBI |
2 | Slot Qty | 60 |
3 | Channel | 196 |
4 | Driver Voltage | VIH : 0.5V ~ 7.0V
VIL : < -0.5V ~ 1.0V Resolution : 10mV |
5 | Driver Capacity | Sink Current : 50mA
Source Current : 50mA |
6 | Driver Skew | ±5ns |
7 | Tr / Tf | 30ns
[ViH:3.3V,1000pF] |
8 | Address | X:22bits Y:22bits |
9 | Power Supply | 115A |
福懋科技具備最多樣化且最新型式的測試機平台,提供最完整記憶體IC測試服務。
Advantest T5833
# | Tester | Advantest T5833 |
---|---|---|
1 | Speed | 1.2 GHz |
2 | I/O, channel | 5120 |
3 | Driver, channel | 4096 |
4 | MRA utility | P/E moudle on-board |
5 | PPS unit (standard / max) | 1152 |
6 | DC unit (standard / max) | 512 |
7 | Duts (max) / system | 512 |
Advantest T5503A
# | Tester | Advantest T5503A |
---|---|---|
1 | Speed | 3 GHz |
2 | I/O, channel | 3072 |
3 | Driver, channel | 2688 |
4 | MRA utility | N/A |
5 | PPS unit (standard / max) | 1024 |
6 | DC unit (standard / max) | 128 |
7 | Duts (max) / system | 256 |
Final Test T5585
# | Tester | Advantest T5585 |
---|---|---|
1 | Speed | 250 / 500 MHz |
2 | I/O, channel | 1152 |
3 | Driver, channel | 1536 |
4 | MRA utility | N / A |
5 | PPS unit (standard / max) | 192 / 192 |
6 | DC unit (standard / max) | 64 / 64 |
7 | Duts (max) / system | 128 |
Final Test T5588
# | Tester | Advantest T5588 |
---|---|---|
1 | Speed | 800 MHz |
2 | I/O, channel | 3072 |
3 | Driver, channel | 3584 |
4 | MRA utility | N / A |
5 | PPS unit (standard / max) | 512 / 512 |
6 | DC unit (standard / max) | 64 / 64 |
7 | Duts (max) / system | 256 |
Final Test T5593
# | Tester | Advantest T5593 |
---|---|---|
1 | Speed | 533 M ~ 1.066 GHz |
2 | I/O, channel | 1536 |
3 | Driver, channel | 1536 |
4 | MRA utility | N / A |
5 | PPS unit (standard / max) | 320 / 320 |
6 | DC unit (standard / max) | 64 / 64 |
7 | Duts (max) / system | 128 |
Final Test T5503HS2
# | Tester | Advantest T5503HS2 |
---|---|---|
1 | Speed | 9 GHz |
2 | I/O, channel | 11392 |
3 | Driver, channel | N / A |
4 | MRA utility | N/A |
5 | PPS unit (standard / max) | 1536 |
6 | DC unit (standard / max) | 448 |
7 | Duts (max) / system | 512 |
Final Test T5503HS

# | Tester | Advantest T5503HS |
---|---|---|
1 | Speed | 4.5 GHz |
2 | I/O, channel | 8064 |
3 | Driver, channel | 1344 |
4 | MRA utility | N / A |
5 | PPS unit (standard / max) | 768 |
6 | DC unit (standard / max) | 128 |
7 | Duts (max) / system | 512 |
MARK:依客戶之LOGO及正印需求,以雷射的方式刻印在IC表面上。
SCAN:提供AOI檢查設備,進行IC錫球檢測及其它外觀檢查,以確保產品規格符合客戶品質需求
Laser Marking EO BM464G

# | In Tray Laser Mark | EO BM464G |
---|---|---|
1 | Laser type | Green Laser |
2 | Max power | 18W |
3 | Laser head | Dual |
4 | Prevision | BIV system |
5 | Marking position accuracy | +/- 0.1 mm |
AOI Scan KLA TENCOR T390

# | In Tray Scanner | KLA TENCOR T390 |
---|---|---|
1 | Lead / Ball Inspection | Standard |
2 | Mark / Orientation Inspection | Standard |
3 | Lead / Ball inspection | 2D&3D(Laser) |
4 | Accuracy / Repeatability | Pitch : 7.5um
Coplanarity: 7.5um |
提供客戶各式電子元件由TRAY盤盛載轉換成捲帶包裝之代工服務
Tray, T & R STI TR-48 MARK V

# | In Tray Tape & Reel | STI TR-48 MARK V |
---|---|---|
1 | Inspection | 2D in pocket |
2 | Taping / Detaping | Standard |
3 | Counter | Every reel with reel counter |
4 | Fail Reject | Auto sort |
REQUEST A CALL
歡迎來信,我們將誠摯為您服務
如果您有任何問題、評論或建議,邀請您將寶貴的想法郵寄至我們的信箱 admin@fatc.com.tw
TALK TO A SPECIALIST
歡迎來電,我們將誠摯為您服務
如果您有任何問題、評論或建議,邀請您將寶貴的想法郵寄至我們的信箱admin@fatc.com.tw
NO. 329, Henan St., Douliu City, Yunlin County 640403, Taiwan
雲林縣斗六市榴中里河南街329號