Micro SD Flash Card
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福懋科技於2007年3月開始量產記憶卡產品。快閃記憶卡可適用於數位相機、錄音器、衛星導航系統、掃描器、手機、PDA、及MP3等產品。

PACKAGE SIZE : 11 mm x 15 mm x 0.72 mm ± 0.1

MICRO SD (T-FLASH)

Flash die :50~150 μm

Controller :75~100 μm

Singulation Cutting : Combination of Laser and Blade

Micro SD Reliability Test

Test Item Test Condition Test Duration
Temperature Humidity Test (T&H) 85℃ / 85% R.H.(40℃ / 93% R.H.) 500 hrs (Qual), 1000 hrs
High Temperature Storage (HTS) 85℃ 500 hrs (Qual), 1000 hrs
Low Temperature Storage (LTS) -40℃ 168 hrs
Temperature Cycling Test (TCT) -25℃ / 85℃, 0.5h / cycle 40 cycles (Qual), 100 cycles, 500 cycles
Salt Water Spray Test 3% NaC1 / 35 24 hrs (Qual), 48 hrs
Bent Test 2 Kg to the center, 60s / time 5 times (Qual), 10 times
Twist Test 0.4Nm Torque (or 10 Degree Twist), x5 clockwise, and x5 counter clockwise / time 3 times (Qual), 5 times, 10 times
Drop Test 1.5 m high free fall 6 faces
Contact Durability 4 sec / cycle 10000 times
WP Switch Durability 4 sec / cycle 10000 times

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