FATC provides professional and accurate wafer probe and classification. The
wafer probers handle wafer size of 8 inches & 12 inches under -55°C ~150°C.
Automatic wafer inspection machine provides quick and reliable wafer visual
inspection, and helps to progress quality management.
Under SEMI standard, we construct a production management system based on
RF ID identification. This system efficiently manages production process and
enables us providing customers the real-time production progress information.
| |
 |
| Tester |
Advantest T5377S |
| Speed |
142.8MHZ |
| I/O, channel |
1024 |
| Driver, channel |
2048 |
| MRA utility |
YES MRA4 |
PPS unit
(standard / max) |
256 |
DC unit
(standard / max) |
128 |
| Duts (max) / system |
256 |
|
|
| |
| |
 |
| Tester |
Advantest T5385 |
| Speed |
266MHZ |
| I/O, channel |
1440 |
| Driver, channel |
2596 |
| MRA utility |
YES MRA4 |
PPS unit
(standard / max) |
288 |
DC unit
(standard / max) |
144 |
| Duts (max) / system |
256 |
|
|
| |
