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Home > About FATC > Testing Service > Burn-In |
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FATC provides professional burn in and final testing service for memory, logical, mixed-signal semiconductors.
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| Burn-In Oven |
SSE-B1120M |
| Burn-In Type |
MBI |
| Slot Qty |
60 |
| Channel |
48 / 96 |
| Driver Voltage |
VIH : 1.5V ~ +8.0V
VIL : < 0.4V |
| Driver Capacity |
Sink Current : 200mA
Source Current : 200mA |
| Driver Skew |
±5ns |
| Overshoot / Undershoot |
Within 10% |
| Tr / Tf |
Less 50ns(with load) |
| Address |
X:16 Y:16 |
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| Burn-In Oven |
SSE –B920 |
| Burn-In Type |
TDBI |
| Slot Qty |
48 |
| Channel |
184 |
| Driver Voltage |
VIH : 2V~+8.0V
VIL : <0.4V
Resolution : 10mV |
| Driver Capacity |
Sink Current : 120mA
Source Current : 120mA |
| Driver Skew |
±5ns |
| Overshoot / Undershoot |
Within 10% |
| Tr / Tf |
Less 25ns(with load) |
| Address |
X:16 Y:16 |
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| Burn-In Oven |
Aehr MTX |
| Burn-In Type |
TDBI |
| Slot Qty |
30 |
| Channel |
256 |
| Driver Voltage |
VIH : 1V ~ +7.0V
VIL : <1V ~ -1.0V
Resolution : 50mV |
| Driver Capacity |
Sink Current : 500mA
Source Current : 300mA |
| Driver Skew |
±5ns |
| Overshoot / Undershoot |
Within 10% |
| Tr / Tf |
Less 10ns(with load) |
| Address |
X:16 Y:16 |
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| Burn-In Oven |
Ando AF8652 |
| Burn-In Type |
TDBI |
| Slot Qty |
48 |
| Channel |
154 |
| Driver Voltage |
VIH : 1V ~ +7.0V
VIL : <50mv
Resolution : 10mV |
| Driver Capacity |
Sink Current : 200mA
Source Current : 200mA |
| Driver Skew |
±5ns |
| Overshoot / Undershoot |
Within 10% |
| Tr / Tf |
Less 30ns(with load) |
| Address |
X:16 Y:16 |
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